Abnormal temperature dependent behaviors of intersystem crossing from rubrene guest dopant with Alq<sub>3</sub> and CBP hosts

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SCIENTIA SINICA Physica, Mechanica & Astronomica, Volume 48, Issue 11: 117001(2018) https://doi.org/10.1360/SSPMA2018-00088

Abnormal temperature dependent behaviors of intersystem crossing from rubrene guest dopant with Alq3 and CBP hosts

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  • ReceivedMar 29, 2018
  • AcceptedApr 23, 2018
  • PublishedAug 3, 2018
PACS numbers

Abstract

In order to study the microscopic process in rubrene-doped organic light emitting diodes, two kinds of devices were fabricated by utilizing the host materials of 4,4’-N,N’-dicarbazolebiphenyl (CBP) and tris-8-hydroxyquinoline aluminum (Alq3), as well as the fluorescent dopant material 5,6,11,12-tetraphenylnaphthacene (rubrene). The magneto-electroluminescence (MEL) curves were measured in the temperature range of 20?K to 300?K. It was found that the MEL curves of rubrene dopant with Alq3 and CBP devices were composed of two parts, namely, the low field effect dominated by the intersystem crossing (ISC) process and the high field effect dominated by the triplet-triplet annihilation (TTA) process. Compared with the conventional un-doped device, the low field effects of these three devices exhibit the same change trend at the same temperature. At different temperatures, these devices show diametrically opposite changes. Specifically, the low field effect in un-doped device shows that the ISC process weakens with the decrease of the temperature, but the low field effects of rubrene dopant with Alq3 and CBP devices show that the ISC process increases with decreasing temperature. By analyzing the energy level structure of the device, the emission spectra of host materials and absorption spectra of guest material, it demonstrated that both the carrier trap effect and the F?rster energy transfer process were included in the microscopic processes of rubrene dopant with Alq3 and CBP devices. The carrier trap effect mainly affects the high field effect of MEL and is basically independent of temperature changes. This anomalous temperature-dependent behavior of ISC process can be ascribed to the suppression of F?rster energy transfer process at low temperatures, leading to an increase in the number of polaron pairs in the host material. Therefore, the ISC interaction between the polaron pairs will increase with decreasing temperature. Our work has a certain role in promoting the understanding for the evolution of microscopic mechanisms in rubrene doped devices.


Funded by

国家自然科学基金(11374242)


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  • Figure 1

    (Color online) The I-V curves, structure schematic, EL spectra of devices, normalized PL spectra and absorption spectra of materials. (a) The I-V curves of devices B and C1, the inset is the structure schematic of device; (b) the normalized PL spectra of Alq3 and CBP films, the normalized EL spectra of devices A, B, and C1, as well as the normalized absorption spectrum of rubrene film; (c) the temperature-dependent normalized EL spectra of device B.

  • Figure 2

    (Color online) Current-dependent MEL curves of devices A, B, and C1 at 300?K and 20?K. (a), (b) Device A; (c), (d) device B; (e), (f) device C1.

  • Figure 3

    (Color online) Temperature-dependent MEL curves of devices at 50?μA. (a) Device A; (b) device B; (c) device C1; (d) device C2.

  • Figure 4

    (Color online) Low-filed effects of MEL curves varying with injected currents and temperature in different devices. (a) Current-dependent low-filed effects of devices A, B, and C1 at 300?K and 20?K, solid dots denote the variation corresponding to 300?K, hollow dots represent the variation corresponding to 20?K; (b) temperature-dependent low-field effects of devices A, B, C1 and C2 at 50?μA.

  • Figure 5

    (Color online) Energy diagrams and microscopic processes of devices. (a) The energy diagram of device A; (b) the schematic of microscopic process in device A; (c) the energy diagram of device B and C1; (d) the schematic of energy transfer and microscopic process in device B and C1.

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